F=180 Bright and Dark Field Semiapochromat Metallurgical Microscope Objective

Key Benefits

• Bright and dark field illumination mode allows contrast enhancement on polished metal and semiconductor surfaces
• Semiapochromat correction reduces chromatic aberration across the visible spectrum
• Working distance ranges from 1mm (100X) to 14.35mm (5X), accommodating various sample heights and stage types
• Numerical aperture up to 0.9 at 100X ensures high resolution and light collection for fine surface features
• Focal length from 1.8mm (100X) to 36mm (5X) matches standard microscope tube lengths
• Resolution down to 0.4μm at 100X enables detection of microstructural features and defects
• Depth of field from 0.4μm (100X) to 12.27μm (5X) supports clear focus across surface variations

Application Scenarios

• Inspection of polished metal cross-sections for grain structure and phase boundaries
• Defect detection on semiconductor wafers and thin-film coatings using dark field contrast
• Failure analysis of solder joints and interconnects in microelectronics
• Quality control of machined or etched metal parts with surface texture variations
• Material science labs examining surface treatments, coatings, and surface fatigue

Who It Is For

• Metallurgy and materials science laboratories
• Semiconductor and microelectronics manufacturing quality control
• Foundry and heat-treatment process validation teams
• Research labs conducting microstructural analysis
• Precision engineering and failure analysis departments

Problems It Solves

• Standard objectives fail to resolve fine surface features on polished metals due to low numerical aperture
• Lack of dark field capability limits visibility of micro-cracks, inclusions, and surface defects
• Inconsistent focus across a sample surface due to shallow depth of field at high magnification
• Mismatched focal length or working distance between objective and microscope body causes focus loss
• Chromatic aberration distorts edge definition and color accuracy in high-magnification imaging

Technical Features

• Semiapochromat optical correction reduces chromatic aberration across visible wavelengths
• Bright and dark field illumination mode selectable via external condenser or adapter
• Working distance varies from 1mm (100X) to 14.35mm (5X), suitable for different sample types
• Numerical aperture ranges from 0.15 (5X) to 0.9 (100X), supporting high resolution and light gathering
• Focal length from 1.8mm (100X) to 36mm (5X), compatible with standard 160mm tube length microscopes
• Resolution down to 0.4μm at 100X, enabling detection of micro-scale features
• Depth of field from 0.4μm (100X) to 12.27μm (5X), allowing focus on surface irregularities

Specifications

Specifications are taken from the AMADA product data for this item. Confirm critical dimensions with us in writing before ordering.

Customization Options

• Available in 5X, 10X, 20X (two variants), 50X, and 100X magnifications
• Each objective supports bright field and dark field illumination modes
• Compatible with standard 160mm tube length metallurgical microscopes
• Designed for use with infinity-corrected or finite optical systems

Comparison With Other Options

Use Guide

• Ensure the microscope tube length is 160mm or infinity-corrected for proper focus
• Use the correct condenser or adapter to switch between bright and dark field illumination
• For 100X, ensure the immersion oil is applied correctly to avoid air gaps
• Adjust focus starting from the lowest magnification to prevent contact with the sample
• Clean the objective lens with lens paper and alcohol before and after use to maintain optical clarity