Dynamic Parameter and Avalanche Testers
Non-destructive transient measurement mainframe with interchangeable test heads.
Overview
The ITC57300 Dynamic Parametric Test System mainframe accepts test heads that perform non-destructive transient measurements on semiconductor devices such as IGBTs, power MOSFETs, diodes and other bipolar devices. Additional bias power supplies and custom personality boards are optional.
The mainframe includes all test equipment and software needed to analyse and perform resistive and inductive switching time, switching losses, gate charge, Trr / Qrr and other transient tests.
Test heads are designed for one specific type of transient test and mate to a special test head receiver on the mainframe. Personality boards inside each test head reconfigure it for a specific device, package and circuit arrangement.
Key Features
Specifications
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FAQ
Configuration decides both. Tell us the device, the package and the parameters you need and our engineers will confirm the configuration, the price and the delivery time.
Yes. Contact our sales engineers to arrange a demonstration or a trial measurement of your own device.
Yes. Installation, training, calibration and repair are handled by our own engineers in China.
Non-destructive transient measurement mainframe with interchangeable test heads.
