Dynamic Parameter and Avalanche Testers
Industry standard unclamped inductive switching tester with 40 ns timing resolution.
Overview
Model ITC55100C is the latest generation of the industry standard ITC55100 series. The system is designed around a powerful micro-controller that gives it a timing resolution of 40 ns, twenty times faster than the previous model. Response time to peak and zero current is improved ten times, which gives greater accuracy for charging and avalanche times and for the reported peak drain current.
Bipolar gate drive is a standard feature. The user can set a total gate drive of up to 30 V and select how much of it is positive and how much negative, which ensures the device is held off during avalanche as certain devices require.
The ITC55100C performs several types of test that conform to MIL-STD-750E Method 3470. Method 3470 tests the capability of P and N channel MOSFETs and IGBTs by stressing them to controlled energy levels, achieved by driving an unclamped inductive load.
Key Features
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FAQ
Configuration decides both. Tell us the device, the package and the parameters you need and our engineers will confirm the configuration, the price and the delivery time.
Yes. Contact our sales engineers to arrange a demonstration or a trial measurement of your own device.
Yes. Installation, training, calibration and repair are handled by our own engineers in China.
Industry standard unclamped inductive switching tester with 40 ns timing resolution.
