Dynamic Parameter and Avalanche Testers
Modular testers for the static and dynamic parameters of discrete power devices.
Overview
ipTEST testers test the static and dynamic parameters of discrete semiconductors such as diodes, transistors, MOSFETs and IGBTs. Top players including Infineon, ST and onsemi use them in their labs and on FT production lines.
The testers use a modular design. Adding a module adds a new test, which keeps the system user-friendly and cost efficient.
ipTEST is a European brand focused on static and dynamic parameter testing of discrete devices: RDSON, BVDSS, VGSth, switching time, Trr / Qrr reverse recovery, Qg gate charge, Rg gate resistance and more. Well known European semiconductor manufacturers such as Infineon, STMicroelectronics and NXP use ipTEST systems for final test and wafer test. The systems can test SiC and GaN devices.
Key Features
ITC57300 Dynamic Parameter Test System
Dynamic Parameter and Avalanche Testers
ITC55100C UIS and EAS Avalanche Tester
Dynamic Parameter and Avalanche Testers
UIS / UIL Avalanche Tester
Dynamic Parameter and Avalanche Testers
SX5012 5000 V 1200 A IGBT Test System
Dynamic Parameter and Avalanche Testers
FAQ
Configuration decides both. Tell us the device, the package and the parameters you need and our engineers will confirm the configuration, the price and the delivery time.
Yes. Contact our sales engineers to arrange a demonstration or a trial measurement of your own device.
Yes. Installation, training, calibration and repair are handled by our own engineers in China.
Modular testers for the static and dynamic parameters of discrete power devices.
