Shanghai JLC Trading Co., Ltd.
STI 5000E Discrete Parametric Tester

Parametric and Curve Tracing Testers

STI 5000E Discrete Parametric Tester

Same proven technology as all 5000 Series testers, built for high speed single test measurement.

BrandSTI (USA)
CategoryParametric and Curve Tracing Testers

Overview

The STI 5000E uses the same proven technology as the rest of the 5000 Series testers. It performs high speed single test measurement and is capable of testing multiple and mixed devices.

Key Features

  • High speed single test measure
  • Capable of testing multiple and mixed devices
  • 1 kV standard, 2 kV optional
  • 1 nA to 50 A standard, 100 A optional
  • 0.1 nA resolution
  • RDSON to 0.1 mOhm resolution
  • Complete self test
  • Auto-calibration
  • Windows application software
  • Fast data capture
  • Optional scanner
  • Optional wafer mapping
  • Optional curve tracer

Devices Covered

MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBSTransistor, Diode, Opto, ZenerRegulator, MOV, Relay

FAQ

Frequently Asked Questions

What is the lead time and the price for this system?

Configuration decides both. Tell us the device, the package and the parameters you need and our engineers will confirm the configuration, the price and the delivery time.

Can we see a demonstration?

Yes. Contact our sales engineers to arrange a demonstration or a trial measurement of your own device.

Do you provide installation, training and calibration in China?

Yes. Installation, training, calibration and repair are handled by our own engineers in China.

STI 5000E Discrete Parametric Tester

Same proven technology as all 5000 Series testers, built for high speed single test measurement.

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